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Research Article

Characterization of Post-Rainy Season Grown Indigenous and Exotic Germplasm Lines of Sorghum for Morphological and Yield Traits

Plant Breeding and Biotechnology 2017;5(2):106-114.
Published online: June 1, 2017

1Nuclear Agriculture and Biotechnology Division Bhabha Atomic Research Centre Trombay, Mumbai 400085, India

2International Crops Research Institute for the Semi-Arid Tropics (ICRISAT), Hyderabad 502324, India

3Agricultural Research Station, Aland road, Gulbarga 585101, India

*Corresponding author: Ashok Badigannavar, ashokmb1@gmail.com, Tel: +91-22-25592335, Fax: +91-22-25505151
• Received: April 17, 2017   • Revised: May 12, 2017   • Accepted: May 14, 2017

Copyright © 2017 The Korean Society of Breeding Science

This is an Open-Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/4.0) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

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  • Post-flowering drought stress response of advanced breeding lines and cultivars in post-rainy season sorghum [Sorghum bicolor (L.)] Moench
    S.K. Pooja, Basavaraj Bagewadi, D.P. Biradar, I.S. Katageri, Rakeshkumar S. Choudhary, B. Fakrudin
    South African Journal of Botany.2025; 178: 266.     CrossRef
  • Genetic variability assessment of post‐flowering drought stress tolerance in selected sorghum (Sorghum bicolor L. Moench) genotypes
    Yirgalem Tsehaye, Fetien Abay, Taye Tadesse, Kassahun Bantte, Temesgen M. Menamo
    Agrosystems, Geosciences & Environment.2025;[Epub]     CrossRef

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Characterization of Post-Rainy Season Grown Indigenous and Exotic Germplasm Lines of Sorghum for Morphological and Yield Traits
Plant Breed. Biotech.. 2017;5(2):106-114.   Published online June 1, 2017
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Characterization of Post-Rainy Season Grown Indigenous and Exotic Germplasm Lines of Sorghum for Morphological and Yield Traits
Plant Breed. Biotech.. 2017;5(2):106-114.   Published online June 1, 2017
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Characterization of Post-Rainy Season Grown Indigenous and Exotic Germplasm Lines of Sorghum for Morphological and Yield Traits
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Fig. 1 Cluster analysis among the sorghum genotypes based on Euclidean distances.
Characterization of Post-Rainy Season Grown Indigenous and Exotic Germplasm Lines of Sorghum for Morphological and Yield Traits

Analysis of variance for yield traits in sorghum genotypes.

Source df Mean squaresz)

Yld SW Ht Flr PL PW Chl LA
Genotypes 175 471.08** 0.86** 4,292.36** 102.53** 65.69** 4.99** 36.15 0.0009
Rep. 1 354.20 0.27** 599.30** 1.76 6.42 3.64 29.56 0.00001
Error 177 115.66 0.04 39.75 5.85 6.48 2.05 35.27 0.00008
CV (%) 18.76 5.82 3.69 4.33 7.26 11.06 11.27 18.38

*Significant at the 0.05 probability level,

**Significant at the 0.01 probability level, CV: Co-efficient of variation.

z)Yld: Grain yield/plant (g), SW: Seed weight (g), Ht: Plant height (cm), Flr: Days to flower, PL: Panicle length (cm), PW: Panicle width (cm), Chl: Chlorophyll content, LA: Leaf area.

Comparison of sorghum germplasm lines and varieties for yield contributing traitsz).

Yld SW Ht Flr PL PW Chl LA
Germplasm
 Numbers 141 141 141 141 141 141 141 141
 Mean 29.75 3.26 168.04 55.64 19.36 4.43 52.68 0.023
 Range 6.7–66.15 1.75–7.05 37.97–263.37 35–73.5 9–33.5 2.0–8.5 37.05–60.90 0.007–0.04
Varieties
 Numbers 36 36 36 36 36 36 36 36
 Mean 39.91 3.35 181.91 56.72 20.45 5.29 52.78 0.02
 Range 7.55–95.1 2.55–4.05 100.45–251.13 48.5–64.5 10.5–31.5 2.5–14.5 41.95–63.2 0.011–0.034

z)Yld: Grain yield/plant (g), SW: Seed weight (g), Ht: Plant height (cm), Flr: Days to flower, PL: Panicle length (cm), PW: Panicle width (cm), Chl: Chlorophyll content, LA: Leaf area.

Genetic parametersz) for grain yield and contributing traits in sorghum germplasm lines.

Traits Mean Vg Vp GCV PCV H2 GA
Yield/plant (g) 31.82 355.42 471.08 59.24 68.20 0.75 33.66
seed weight (g) 3.28 0.828 0.86 27.74 28.27 0.76 1.44
Days to flower 55.86 96.68 102.53 17.60 18.12 0.96 20.06
Panicle length (cm) 19.58 59.20 65.69 39.29 41.39 0.98 16.32
Panicle width (cm) 4.61 2.94 4.99 37.19 48.45 0.98 4.52
Plant height (cm) 170.86 4,252.61 4,292.36 38.16 38.34 0.98 132.21
Chlorophyll content 52.7 0.88 36.15 1.78 11.40 0.99 12.34
Leaf area 0.23 0.000005 0.000085 0.97 4.01 0.99 0.02

z)Vg and Vp: Genetic and phenotypic variances, GCV and PCV (%): Genetic and phenotypic coefficient of variation, H2: Broad sense heritability, GA: Genetic advance.

Correlation coefficients for grain yield and contributing traitsz) in sorghum germplasm lines.

Trait Yld SW Ht Flr PL PW Chl LA
Yield 1
SW 0.31** 1
Ht 0.11* 0.06 1
Flr 0.23** −0.03 0.42** 1
PL 0.13* −0.15** 0.11* 0.05 1
PW 0.38** 0.31** 0.28** 0.24** 0.08 1
Chl 0.006 0.04 0.07 0.02 0.01 0.05 1
LA 0.29** 0.14** 0.12* 0.31** −0.06 0.20** 0.11* 1

*Significant at the 0.05 probability level,

**Significant at the 0.01 probability level.

z)Yld: Grain yield/plant (g), SW: Seed weight (g), Ht: Plant height (cm), Flr: Days to flower, PL: Panicle length (cm), PW: Panicle width (cm), Chl: Chlorophyll content, LA: Leaf area.

Mean and range values for yield and its contributing traitsz) of each cluster.

Cluster No. of genotypes Parameter Yld (g) SI (g) Ht Flr PL PW Chl LA
I 42 Mean 24.63 3.14 107.25 50.81 18.43 3.57 52.44 0.02
Range 7.20–51.60 1.75–4.40 37.98–144.55 37.00–66.00 9.00–27.50 2.00–6.50 37.05–63.20 0.009–0.04
II 24 Mean 26.01 3.12 236.02 58.46 20.03 4.80 53.81 0.02
Range 7.55–54.30 1.90–3.70 214.38–263.38 46.00–69.50 9.50–32.00 2.00–14.50 45.75–60.90 0.01–0.03
III 105 Mean 33.67 3.35 179.81 57.15 19.86 4.92 52.56 0.02
Range 6.70–74.45 1.75–7.05 140.88–218.05 35.00–73.50 9.00–33.50 2.00–8.50 38.7560.45 0.01–0.04
IV 06 Mean 73.07 3.73 199.06 58.25 21.13 5.88 52.61 0.03
Range 62.15–95.10 3.35–4.45 181.30–208.25 55.50–64.00 16.00–23.50 4.50–7.00 41.95–61.25 0.02–0.05

z)Yld: Grain yield/plant (g), SW: Seed weight (g), Ht: Plant height (cm), Flr: Days to flower, PL: Panicle length (cm), PW: Panicle width (cm), Chl: Chlorophyll content, LA: Leaf area.

Table 1 Analysis of variance for yield traits in sorghum genotypes.

Significant at the 0.05 probability level,

Significant at the 0.01 probability level, CV: Co-efficient of variation.

Yld: Grain yield/plant (g), SW: Seed weight (g), Ht: Plant height (cm), Flr: Days to flower, PL: Panicle length (cm), PW: Panicle width (cm), Chl: Chlorophyll content, LA: Leaf area.

Table 2 Comparison of sorghum germplasm lines and varieties for yield contributing traitsz).

Yld: Grain yield/plant (g), SW: Seed weight (g), Ht: Plant height (cm), Flr: Days to flower, PL: Panicle length (cm), PW: Panicle width (cm), Chl: Chlorophyll content, LA: Leaf area.

Table 3 Genetic parametersz) for grain yield and contributing traits in sorghum germplasm lines.

Vg and Vp: Genetic and phenotypic variances, GCV and PCV (%): Genetic and phenotypic coefficient of variation, H2: Broad sense heritability, GA: Genetic advance.

Table 4 Correlation coefficients for grain yield and contributing traitsz) in sorghum germplasm lines.

Significant at the 0.05 probability level,

Significant at the 0.01 probability level.

Yld: Grain yield/plant (g), SW: Seed weight (g), Ht: Plant height (cm), Flr: Days to flower, PL: Panicle length (cm), PW: Panicle width (cm), Chl: Chlorophyll content, LA: Leaf area.

Table 5 Mean and range values for yield and its contributing traitsz) of each cluster.

Yld: Grain yield/plant (g), SW: Seed weight (g), Ht: Plant height (cm), Flr: Days to flower, PL: Panicle length (cm), PW: Panicle width (cm), Chl: Chlorophyll content, LA: Leaf area.